Sayano-Shushenskaya branch of the Siberian Federal University (Republic of Khakassia, Russian Federation)


Summary: A method of increasing the sensitivity of measurements, based on nonlinear photographic interference pattern and process it using the program Femtoscan, measurement sensitivity.

Key words: double-beam microinterferometer; nonlinear photo registration; reflective diffraction grating, the program Femtoscan.
 


Branch of science: Physics and mathematics
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