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Namangan, Uzbekistan

Number of publications: 1

Summary: In the short-wave area of a spectral characteristic of solar cells (SС) where the frontal layer of structure is responsible, sharper recession of sensitivity is observed. In article results of research of process of diffusion of impurity are given to single-crystal silicon through oxide coverings of SiOx and their influence on transformation of characteristics of structures of SС.

Key words: solar cells, short-wave part, protecting cover, effective thickness, spectral characteristic.


Branch of science: Technical sciences
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